发明名称 PROBE STRUCTURE AND PROBE CARD HAVING THE SAME
摘要 PURPOSE: A probe structure contacted with a target and a probe card having the same are provided to prevent the short circuit between probe units due to a metallic sealing member without an additional metallic sealing member for fixing a probe unit. CONSTITUTION: In a probe structure contacted with a target and a probe card having the same, a guide plate(110) comprises a first slit(112) for accommodating and guiding a probe unit(130). A fixing plate(120) is combined with the bottom of the guide plate and includes a through hole(122) corresponding to the slit. The probe unit comprises a body portion(131), and a terminal(133) and a probe(132). The probe is protruded from the top of the guide plate.
申请公布号 KR20110039952(A) 申请公布日期 2011.04.20
申请号 KR20090097034 申请日期 2009.10.13
申请人 MICO TN LTD. 发明人 KIM, HYEONG IK
分类号 H01L21/66 主分类号 H01L21/66
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