发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SEMICONDUCTOR DEVICE
摘要 An object is to reduce contact resistance between an oxide semiconductor layer and source and drain electrode layers electrically connected to the oxide semiconductor layer in a thin film transistor including the oxide semiconductor layer. The source and drain electrode layers have a stacked structure of two or more layers. In this stack of layers, a layer in contact with the oxide semiconductor layer is a thin indium layer or a thin indium-alloy layer. Note that the oxide semiconductor layer contains indium. A second layer or second and subsequent layers in the source and drain electrode layers are formed using an element selected from Al, Cr, Cu, Ta, Ti, Mo, and W, an alloy containing any of these elements as a component, an alloy containing any of these elements in combination, or the like.
申请公布号 WO2011043164(A1) 申请公布日期 2011.04.14
申请号 WO2010JP65889 申请日期 2010.09.08
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD.;YAMAZAKI, SHUNPEI;HIRAISHI, SUZUNOSUKE;AKIMOTO, KENGO;SAKATA, JUNICHIRO 发明人 YAMAZAKI, SHUNPEI;HIRAISHI, SUZUNOSUKE;AKIMOTO, KENGO;SAKATA, JUNICHIRO
分类号 H01L29/786;C01G15/00;G02F1/1368;H01L21/28 主分类号 H01L29/786
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