发明名称 Method of measuring length of measurement object article in micro-structure
摘要 A substrate comprises a substrate main body having a surface on which a measurement object article is to be formed. A reference scale is disposed on the surface of the substrate main body in the vicinity of a region of the surface where the measurement object article is to be formed. The reference scale has adjacent graduations spaced-apart a preselected distance from one another.
申请公布号 US7923267(B2) 申请公布日期 2011.04.12
申请号 US20060346826 申请日期 2006.02.03
申请人 SII NANOTECHNOLOGY INC. 发明人 MUNEKANE MASANAO;TASHIRO JUNICHI
分类号 G01R31/26 主分类号 G01R31/26
代理机构 代理人
主权项
地址