发明名称 FABRICATION METHOD OF PHASE-CHANGE RANDOM ACCESS MEMORY DEVICE
摘要 <p>PURPOSE: A phase shift memory device manufacturing method is provided to improve the phase shift efficiency by maximizing the heat focusing effect by manufacturing the phase shift material in confined shape. CONSTITUTION: A lower electrode(103) is formed on a semiconductor substrate(101). An inter-layer insulating layer(105) is formed on the overall structure including the lower electrode. A lower electrode contact hole of the predetermined size is formed to expose the surface of the lower electrode. A spacer insulating layer is formed on the overall structure including the lower electrode contact hole.</p>
申请公布号 KR20110035784(A) 申请公布日期 2011.04.06
申请号 KR20090093619 申请日期 2009.09.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 RYU, CHEOL HWI;PARK, JUNG WOO;JUNG, BO KYOUNG;SHIN, CHANG HYUP
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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