发明名称 |
FABRICATION METHOD OF PHASE-CHANGE RANDOM ACCESS MEMORY DEVICE |
摘要 |
<p>PURPOSE: A phase shift memory device manufacturing method is provided to improve the phase shift efficiency by maximizing the heat focusing effect by manufacturing the phase shift material in confined shape. CONSTITUTION: A lower electrode(103) is formed on a semiconductor substrate(101). An inter-layer insulating layer(105) is formed on the overall structure including the lower electrode. A lower electrode contact hole of the predetermined size is formed to expose the surface of the lower electrode. A spacer insulating layer is formed on the overall structure including the lower electrode contact hole.</p> |
申请公布号 |
KR20110035784(A) |
申请公布日期 |
2011.04.06 |
申请号 |
KR20090093619 |
申请日期 |
2009.09.30 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
RYU, CHEOL HWI;PARK, JUNG WOO;JUNG, BO KYOUNG;SHIN, CHANG HYUP |
分类号 |
H01L27/115;H01L21/8247 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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