发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor element for achieving a stable withstand voltage without performing neutron emission. SOLUTION: This semiconductor device includes: a first conductivity type first semiconductor region; a second conductivity type second semiconductor region formed from one-side surface of the first semiconductor region; a second conductivity type third semiconductor region formed to surround the second semiconductor region and extending from the one-side surface of the first semiconductor region; a first conductivity type fourth semiconductor region formed to surround the third semiconductor region and extending from the one-side surface of the first semiconductor region; a first conductivity type fifth semiconductor region extending to one-side main surface of the first semiconductor region without affecting the second, third and fourth semiconductor regions extending to the one-side main surface of the first conductivity type first semiconductor region; and a first conductivity type sixth semiconductor region extending from the other-side surface of the first semiconductor region. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011066171(A) 申请公布日期 2011.03.31
申请号 JP20090215133 申请日期 2009.09.17
申请人 HITACHI LTD 发明人 SHINAGAWA NAOTSUGU;SAITO KATSUAKI;SAEKI TAKAHIRO;YASUDA KENTARO
分类号 H01L29/861;H01L21/329;H01L29/06;H01L29/739;H01L29/78 主分类号 H01L29/861
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