| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a device to inspect and evaluate a response characteristic test of a resistive film type touch panel in a very short time. <P>SOLUTION: A high speed inspection and evaluation device (a) includes tactile pressing rod multistage arrays wherein tactile pressing rod arrays each of which includes many tactile pressing rods arranged linearly in a column are arranged in many stages on an inspection support base 1, (b) wherein each tactile pressing rod is installed on the support base to project upward to an inspection surface from below through a hole 3 of a plate board 2 installed at an upper part of the tactile pressing rod multistage arrays, (c) includes a sample placing means which places the inspection surface of a target inspection sample so that the inspection surface is turned downward to face the tactile pressing rods, and (d) includes a control means for controlling each tactile pressing rod to dot at prescribed spacings and (e) a determination means for determining contact position of the tactile pressing rod and inspection result. <P>COPYRIGHT: (C)2011,JPO&INPIT</p> |
