发明名称 SEMICONDUCTOR MEMORY DEVICE AND LAYOUT STRUCTURE OF SUB-WORD LINE CONTROL SIGNAL GENERATOR
摘要 A semiconductor memory device and a layout structure of sub-word line control signal generators. The sub-word line control signal generators are configured to supply a sub-word line control signal of a predefined voltage level to a sub-word line driver to enable a sub-word line of a memory cell array. At least two sub-word line control signal generators are disposed, respectively, at edge areas of the memory cell array, to directly supply the sub-word line control signal to one selected sub-word line driver, thereby reducing the power consumption, including for example, VPP voltage. Embodiments of the present invention also reduce the number of VPP power lines, thereby lessening a noise disturbance.
申请公布号 US2011075505(A1) 申请公布日期 2011.03.31
申请号 US20100962951 申请日期 2010.12.08
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JANG DONG-SU;JEONG IN-CHUL
分类号 G11C8/08 主分类号 G11C8/08
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