发明名称 METHOD OF REDUCING MEMORY EFFECTS IN SEMICONDUCTOR EPITAXY
摘要 A method of reducing memory effects during an epitaxial growth process is provided in which a gas mixture comprising hydrogen gas and a halogen-containing gas is used to flush the CVD reaction chamber between growth steps.
申请公布号 US2011073874(A1) 申请公布日期 2011.03.31
申请号 US20090993938 申请日期 2009.05.29
申请人 DOW CORNING CORPORATION 发明人 LOBODA MARK
分类号 H01L29/12;C30B25/02 主分类号 H01L29/12
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