SYSTEM AND METHOD FOR MEASURING EFFICIENCY IN SEMICONDUCTOR DEVICE

摘要

PURPOSE: A system and a method for measuring efficiency in semiconductor device are provided to easily identify the relationship between element characteristic and the life cycle according to the usage time. CONSTITUTION: A loader(1) loads the power semiconductor device to be measured. The measurement modules(10-40) are connected to both ends of the loader to measure the current per voltage based on the particular temperature of the power semiconductor device. A main processor module(50) continuously receives the voltage comparison current. The accumulated final data is outputted.