发明名称 APPARATUS AND METHOD OF MEASURING FLATNESS OF FLANGE SURFACE
摘要 PURPOSE: A device and a method for measuring the flatness on a flange surface are provided to measure the flatness of a target without a precise transfer unit. CONSTITUTION: A device and a method for measuring the flatness on a flange surface comprises a support point(120), a probe(130), and a measuring sensor. The support point is protruded from the top of a fixed base to mount the measuring surface of a target. The probe is installed to be able to move up and down. The measuring sensor measures each protruded position of the probe.
申请公布号 KR20110030750(A) 申请公布日期 2011.03.24
申请号 KR20090088322 申请日期 2009.09.18
申请人 ACCULINE CO., LTD.;SEJONG IND. CO., LTD. 发明人 HAM, SOON SIK;SON, GYEONG GON
分类号 G01B5/207;G01B7/287 主分类号 G01B5/207
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