发明名称 |
APPARATUS AND METHOD OF MEASURING FLATNESS OF FLANGE SURFACE |
摘要 |
PURPOSE: A device and a method for measuring the flatness on a flange surface are provided to measure the flatness of a target without a precise transfer unit. CONSTITUTION: A device and a method for measuring the flatness on a flange surface comprises a support point(120), a probe(130), and a measuring sensor. The support point is protruded from the top of a fixed base to mount the measuring surface of a target. The probe is installed to be able to move up and down. The measuring sensor measures each protruded position of the probe.
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申请公布号 |
KR20110030750(A) |
申请公布日期 |
2011.03.24 |
申请号 |
KR20090088322 |
申请日期 |
2009.09.18 |
申请人 |
ACCULINE CO., LTD.;SEJONG IND. CO., LTD. |
发明人 |
HAM, SOON SIK;SON, GYEONG GON |
分类号 |
G01B5/207;G01B7/287 |
主分类号 |
G01B5/207 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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