发明名称 METHOD AND SYSTEM FOR SECURELY DETERMINING MANHATTAN DISTANCE
摘要 PROBLEM TO BE SOLVED: To provide a method and a system for determining securely the Manhattan distance between a first signal and a second signal. SOLUTION: A first signal is mapped to a first binary signal, and a second signal is mapped to a second binary signal, such that a squared distance between the first binary signal and the second binary signal equals the Manhattan distance. Dimensions of the first binary signal and the second binary signal are reduced respectively to produce a first low dimensional signal and a second low dimensional signal, such that a squared distance between the first low dimensional signal and the second low dimensional signal approximates the squared distance between the first binary signal and the second binary signal. The squared distance between the first low dimensional signal and the second low dimensional signal is securely determined to securely determine the Manhattan distance between the first signal and the second signal. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011055469(A) 申请公布日期 2011.03.17
申请号 JP20100127477 申请日期 2010.06.03
申请人 MITSUBISHI ELECTRIC RESEARCH LABORATORIES INC 发明人 SUN WEI;RANE SHANTANU D;ANTHONY VETRO
分类号 H04L9/10 主分类号 H04L9/10
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