发明名称 |
METHOD FOR CONSTANT POWER DENSITY SCALING |
摘要 |
PURPOSE: A method for power density scaling which settable scaling factor is set based on fixed scaling factor is provided to determines a integrated circuit. CONSTITUTION: An IC(Integrated Circuit) design is prepared(505). A manufacturing process based on parameters is provided(510). Based on settable scaling factor, parameters of IC are determined. Based on a fixed scaling factor, the settable scaling factor is set. The circuit design with a manufacturing process based on a parameter is used for generating circuit layout(515). A design rule check is performed(520). The IC is manufactured(530).
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申请公布号 |
KR20110025076(A) |
申请公布日期 |
2011.03.09 |
申请号 |
KR20100077540 |
申请日期 |
2010.08.11 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. |
发明人 |
WANN CLEMENT HSINGJEN |
分类号 |
G06F17/50;H01L21/8228;H01L27/092 |
主分类号 |
G06F17/50 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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