发明名称 Lithography Machine and Substrate Handling Arrangement
摘要 An arrangement comprising a plurality of charged particle lithography apparatuses, each charged particle lithography apparatus having a vacuum chamber. The arrangement further comprises a common robot for conveying wafers to the plurality of lithography apparatuses, and a wafer load unit for each charged particle lithography apparatus arranged at a front side of each respective vacuum chamber. The plurality of lithography apparatuses are arranged in a row with the front side of the lithography apparatuses facing an aisle accommodating passage of the common robot for conveying wafers to each apparatus, and the rear side of each lithography apparatus faces an access corridor, and the back wall of each vacuum chamber is provided with an access door for access to the respective lithography apparatus.
申请公布号 US2011049393(A1) 申请公布日期 2011.03.03
申请号 US20100709647 申请日期 2010.02.22
申请人 MAPPER LITHOGRAPHY IP B.V. 发明人 DE BOER GUIDO;DE JONG HENDRIK JAN;BALTUSSEN SANDER
分类号 G21G5/00 主分类号 G21G5/00
代理机构 代理人
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