发明名称 |
ACTIVE NON-CONTACT PROBE CARD |
摘要 |
Provided is an active non-contact probe card including a carrier, a support base, a piezoelectric material layer, an active sensor array chip and a control circuit. The support base is disposed on the carrier. The piezoelectric material layer is connected with the support base. The position of the active sensor array chip with respect to the carrier is determined according to the thicknesses of the support base and the thicknesses of the piezoelectric material layer. A control circuit provides a control voltage to the piezoelectric material layer to control the thickness of the piezoelectric material layer, so as to adjust the position of the active sensor array chip with respect to the carrier.
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申请公布号 |
US2011050262(A1) |
申请公布日期 |
2011.03.03 |
申请号 |
US20100723415 |
申请日期 |
2010.03.12 |
申请人 |
CHEN MING-KUN;LIN YI-LUNG |
发明人 |
CHEN MING-KUN;LIN YI-LUNG |
分类号 |
G01R31/02;G01R27/26;G01R31/302 |
主分类号 |
G01R31/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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