发明名称 SEMICONDUCTOR DEVICE, ACTIVE MATRIX SUBSTRATE, AND DISPLAY DEVICE
摘要 <p>Disclosed is a semiconductor device that can decrease leakage current regardless of the surrounding temperature. Further disclosed is an active matrix substrate utilizing same, and a display device. A switching unit (semiconductor device) (18) having a plurality of thin film transistors connected in series is provided with a plurality of gate electrodes (g1-g4); a channel region (30) and a low impurity concentration region (29) provided to each of the plurality of transistors and contained in a silicon layer (semiconductor layer) (SL) provided below the plurality of gate electrodes (g1-g4); and a bottom gate electrode (21) provided below the silicon layer (SL). Signals are supplied to the bottom gate electrode (29) in phase with those of each gate electrode (g1-g4).</p>
申请公布号 WO2011024911(A1) 申请公布日期 2011.03.03
申请号 WO2010JP64511 申请日期 2010.08.26
申请人 SHARP KABUSHIKI KAISHA;KITAKADO HIDEHITO 发明人 KITAKADO HIDEHITO
分类号 H01L29/786;G02F1/1368;G09F9/30;H01L21/28;H01L21/8234;H01L27/088;H01L29/423;H01L29/49 主分类号 H01L29/786
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