| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To inspect a cross access function of a dual interface card. <P>SOLUTION: This inspection system includes: a means reading a card ID through an interface of a contact IC to a database and an IC card, accessing an application of each of the contact IC and a non-contact IC, making the card ID associated with access results thereof, and storing them into the database; a means reading the card ID through an interface of the non-contact IC to the IC card, accessing the application of each of the contact IC and the non-contact IC, making the card ID associated with access results thereof, and storing them into the database; and a means collating the access result in the interface of the contact IC and the access result in the interface of the non-contact IC associated with the card ID about each of the contact IC, the non-contact IC and respective applications in the database. <P>COPYRIGHT: (C)2011,JPO&INPIT</p> |
