发明名称 Immersion photolithography system and method using inverted wafer-projection optics interface
摘要 A liquid immersion photolithography system includes an exposure system that exposes a substrate with electromagnetic radiation, and also includes an optical system that images the electromagnetic radiation on the substrate. A liquid is between the optical system and the substrate. The projection optical system is positioned below the substrate.
申请公布号 US7898643(B2) 申请公布日期 2011.03.01
申请号 US20050187010 申请日期 2005.07.22
申请人 ASML HOLDING N.V. 发明人 SEWELL HARRY
分类号 G02B13/14;G03B27/42;G03F7/20;H01L21/027 主分类号 G02B13/14
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