发明名称 Optical defect inspection apparatus
摘要 A laser beam oscillated from a laser source is folded in its path by first and second plane mirrors and enters a beam expander. The surface of each plane mirror is deteriorated with illumination by the laser beam and the reflectance is reduced. To avoid a light quantity of the laser beam entering the beam expander from being reduced below a reference value, when the laser beam is illuminated over a certain time, a position on each of the first and second plane mirrors at which the laser beam is illuminated is changed by a structure for rotating and/or translating a reflecting surface of each plane mirror on a plane, which includes the plane mirror, while an optical axis is kept same. Thus, the useful life of each plane mirror can be prolonged without displacing the optical axis.
申请公布号 US7894052(B2) 申请公布日期 2011.02.22
申请号 US20100705031 申请日期 2010.02.12
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 AIZAWA NORIYUKI;KAWAKAMI HIROYUKI;ZAMA KAZUHIRO;TAKAHASHI KAZUO;MIYAZAKI YUSUKE;TANAKA SHINGO
分类号 G01N21/00 主分类号 G01N21/00
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