发明名称 APPARATUS AND METHOD FOR MEASURING OPTICAL MODAL GAIN PROPERTIES
摘要 The present invention relates to an apparatus for measuring optical modal gain properties, comprising: a specimen-mounting unit on which a specimen is mounted; an energy-applying unit which applies energy into a stripe shape to the specimen; a stripe length adjusting unit which adjusts the length of the stripe-shaped energy; and a specimen properties measuring unit which analyzes an amplified spontaneous emission (ASE) spectrum of light emitted by the specimen, to generate a contour map consisting of wavelength, energy stripe length, and modal gain. According to the present invention, modal gain can be determined in accordance with the wavelength of light and geometric length of an inner cavity during the manufacture of a small light-emitting device, thereby obtaining an optimized device in an easy and efficient manner during a manufacturing process.
申请公布号 WO2011019183(A2) 申请公布日期 2011.02.17
申请号 WO2010KR05227 申请日期 2010.08.10
申请人 PUSAN NATIONAL UNIVERSITY INDUSTRY-UNIVERSITY COOPERATION FOUNDATION;KYHM, KWANG SEUK;KIM, BUM JIN 发明人 KYHM, KWANG SEUK;KIM, BUM JIN
分类号 G01J3/443 主分类号 G01J3/443
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