发明名称 Method for bispectral picking of anelliptical NMO correction parameters
摘要 Method of determining the velocity V and anellipticity &eegr; parameters for processing seismic traces in a common midpoint (CMP) gather comprising:—a preliminary step to define a plurality of nodes (dtn, τo), for each node (dtn, τo) defined in the preliminary step, the following steps:—for static NMO correction of traces in the CMP gather as a function of the values of the said parameters dtn and τo at the node considered, and calculation of the semblance function associated with the said NMO correction for the node considered; and—for each picked time to, a step including determination of the maximum semblance node (dtn (to), τo (to)),—and a final step to convert the dtn (to) and τo (to) parameters, so as to obtain the velocity to) and anellipticity &eegr; (to) laws.
申请公布号 US7889599(B2) 申请公布日期 2011.02.15
申请号 US20040565405 申请日期 2004.07.20
申请人 CGGVERITAS SERVICES SA 发明人 SILIQI RISTO
分类号 G01V1/00;G01V1/36 主分类号 G01V1/00
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