发明名称 IN-LINE METROLOGY METHODS AND SYSTEMS FOR SOLAR CELL FABRICATION
摘要 In-line metrology methods and systems for use with laser-scribing systems used in solar-cell fabrication are disclosed. Such methods and systems can involve a variety of components, for example, a device for measuring the amount of power input to a laser, a power meter for measuring laser output power, a beam viewer for measuring aspects of a laser beam, a height sensor for measuring a workpiece height, a microscope for measuring workpiece features formed by the laser-scribing system, and a system for monitoring a laser-scribing system and annunciating a warning(s) and/or an error message(s) when operational limits are exceeded. In-line metrology methods can also include the processing of output beam reflections so as to track beam drift over time and/or provide for focusing of an imaging device.
申请公布号 WO2011017570(A2) 申请公布日期 2011.02.10
申请号 WO2010US44618 申请日期 2010.08.05
申请人 APPLIED MATERIALS, INC.;MANENS, ANTOINE P.;SHIU, TING-RUEI;SHAMOUN, BASSAM;HSU, WEI-YUNG;THOTHADRI, MANIVANNAN 发明人 MANENS, ANTOINE P.;SHIU, TING-RUEI;SHAMOUN, BASSAM;HSU, WEI-YUNG;THOTHADRI, MANIVANNAN
分类号 H01L31/18;B23K26/36;H01L31/042;H01S3/10 主分类号 H01L31/18
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