发明名称 Successive approximate capacitance measurement circuit
摘要 A capacitance measurement circuit includes a current source, a switch, and a comparator. The current source is coupled to drive a current through a circuit node. The switch is coupled to the circuit node to switch the current into a device under test (“DUT”) capacitor. The comparator includes first and second input ports. The comparator is coupled to compare a first voltage received on the first input port against a reference voltage received on the second input port. The first voltage is related to the current driven through the circuit node, a frequency at which the switch is switched, and a capacitance of the DUT capacitor.
申请公布号 US7884621(B2) 申请公布日期 2011.02.08
申请号 US20070983291 申请日期 2007.11.07
申请人 CYPRESS SEMICONDUCTOR CORPORATION 发明人 SNYDER WARREN S.
分类号 G01R27/26 主分类号 G01R27/26
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