发明名称 Smart card and method of testing smart card
摘要 A smart card includes a non-volatile memory, a CPU, and a plurality of pads. The non-volatile memory stores a test program. The CPU is released from a reset state in response to a test enable signal. The CPU executes the test program stored in the non-volatile memory based on predetermined flag information and stores a result of the test program in the non-volatile memory.
申请公布号 US7883020(B2) 申请公布日期 2011.02.08
申请号 US20070763856 申请日期 2007.06.15
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE SEUNG-WON
分类号 G06K19/06 主分类号 G06K19/06
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