AN APPARATUS FOR ESTIMATING FAULT COVERAGE OF EMBEDDED SYSTEMS AND THE METHOD THEREOF

摘要

PURPOSE: An automated test equipment of an embedded system for reducing rate of detecting defect for using the deformity pouring experiment is provided to obtain time and cost about a bit unit fault of the embedded system. CONSTITUTION: A defect generation part(112) generates deformity to consider the rate of detecting defect evaluation. A deformity screening device(113) distinguishes the deformity based on the information about the change of the execution hunting register of the software of an embedded system and the memory value corresponding to the execution hunting register. A deformity implantation part injects the error generation deformity into the embedded system in order to distinguish the influence that the error generation deformity.