发明名称 aberration measuring device with analyzer of isodioprtial eye zones
摘要 An aberration measuring device with analyzer of isodioprtial eye zones contains a lighting system for the formation of light microspot on the retina, lens for imaging of eye pupil in the plane of image photodetector as well as spatial filter in the form of opaque screen with a microopening.Between the lens and the image recording device of eye pupil the movable platform is located on which the turning in the transverse plane screen is installed with two openings, one of which is placed as a spatial filter as microdiaphragm, and in he second opening, which diameter is greater than the diameter of the first opening, transparent plate is placed with translucent pattern, and between the lens and the plate an additional system of light diods is located to illuminate a translucent image.
申请公布号 UA56622(U) 申请公布日期 2011.01.25
申请号 UA20100006788U 申请日期 2010.06.01
申请人 "KYIV POLYTECHNIC INSTITUTE", NATIONAL TECHNICAL UNIVERSITY OF UKRAINE 发明人 CHYZH IHOR HENRIKHOVYCH;AFONCHYNA NATALIA BORYSIVNA
分类号 A61B3/10;A61B3/18 主分类号 A61B3/10
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