| 摘要 |
An apparatus and method for testing sense amplifier threshold voltages on an integrated circuit includes one or more sense amplifier modules each including a number of sense amplifier circuits, a voltage generator unit, and detection logic. The voltage generator unit may select a differential voltage to supply to at least some of the sense amplifier circuits, and each sense amplifier circuit may be configured to generate an output value that is dependent upon the applied differential voltage in response to receiving an enable signal. The detection logic may detect and capture an output value of each of the sense amplifier circuits. In one implementation, the voltage generator unit may iteratively select a different differential voltage in response to a control input. Accordingly, the detection logic may capture the output value of the sense amplifiers after each change in differential voltage.
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