发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME
摘要 To provide a manufacturing method in which LDD regions with different widths are formed in a self-aligned manner, and the respective widths are precisely controlled in accordance with each circuit. By using a photomask or a reticle provided with an auxiliary pattern having a light intensity reduction function formed of a diffraction grating pattern or a semi-transparent film, the width of a region with a small thickness of a gate electrode can be freely set, and the widths of two LDD regions capable of being formed in a self-aligned manner with the gate electrode as a mask can be different in accordance with each circuit. In one TFT, both of two LDD regions with different widths overlap a gate electrode.
申请公布号 US2011012113(A1) 申请公布日期 2011.01.20
申请号 US20100888750 申请日期 2010.09.23
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 OHNUMA HIDETO;MONOE SHIGEHARU
分类号 H01L29/06;H01L27/12 主分类号 H01L29/06
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