| 摘要 |
PROBLEM TO BE SOLVED: To test a semiconductor device in a testing environment using a low-speed test device having few terminals.SOLUTION: The semiconductor device includes an input terminal (122); a termination circuit (121) for specifying the input impedance of the input terminal; and a resistor (113) for fetching the output signal from an input circuit in synchronization with a clock signal. The semiconductor device includes a pattern generation section (109); and a pattern check section (107) for comparing an output signal from the resistor with the expected value. The termination circuit includes a first resistance element (132); a first transistor (131); a second resistive element (133); and a second transistor (134). Use of a low-speed test device having a small number of terminals is made possible, by controlling the first and second transistors according to a pattern signal generated by the pattern generating section, and by providing a self-diagnosis control circuit (115) for transmitting the pattern signal to the input circuit. |
