| 摘要 |
PURPOSE: A memory testing device is provided to uniformly maintain the temperature of a jig position space by restrictively securing the space of a jig. CONSTITUTION: A body(11) includes various circuit parts for a test. A jig(12) is installed on the body. A semiconductor memory that is a test target is mounted on the jig. A cold and hot air generator(20) forms a test space which receives the jig and controls the temperature of the test space. |
