| 摘要 |
Logic circuit information in which flip-flops of a semiconductor integrated circuit subjected to designing and a logic circuit between flip-flops are defined is input. The logic circuit information is analyzed to detect a logic circuit sandwiched by two flip-flops. The number of logic stages of the detected logic circuit is counted. It is determined, according to the counted number of logic stages, to which substrate potential a cell used for the logic circuit is to be connected.
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