PICK-AND-PLACE MODULE FOR TEST HANDLER

摘要

PURPOSE: A pick-and-place module for a test handler is provided to reduce physical and time loss which is required for replacement of a component. CONSTITUTION: A main body(110) has N vacuum flow path and a kit has M picker. The vacuum path corresponds to the whole or part of the vacuum flow path and the picker is communicated with the vacuum path. A semiconductor device is gripped or dropped through vacuum pressure which is transferred through vacuum path. The kit is detachable from the main body through hook combining.