发明名称 METHOD AND APPARATUS FOR MANUFACTURING SEMICONDUCTOR SUBSTRATE DEDICATED TO SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method for manufacturing a semiconductor substrate dedicated to a semiconductor device, for easily forming a gettering site in short time and having less possibility that transition defect occurs due to internal stress caused by formation of the gettering site. SOLUTION: A stage heater 48 heats a single crystal wafer 2 at a predetermined temperature range, e.g. 400-1,000°C in advance. Thus, a difference between a maximally achieving temperature near a condensing point in incidence of a laser beam Q2 and the temperature of the entire single crystal wafer 2 is maintained small. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2010283193(A) 申请公布日期 2010.12.16
申请号 JP20090136024 申请日期 2009.06.05
申请人 SUMCO CORP 发明人 KURITA KAZUNARI
分类号 H01L21/322;H01L21/268;H01L27/148 主分类号 H01L21/322
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