发明名称 TANTALUM SILICON OXYNITRIDE HIGH-K DIELECTRICS AND METAL GATES
摘要 Electronic apparatus and methods of forming the electronic apparatus include a tantalum silicon oxynitride film on a substrate for use in a variety of electronic systems. The tantalum silicon oxynitride film may be structured as one or more monolayers. The tantalum silicon oxynitride film may be formed using a monolayer or partial monolayer sequencing process. Metal electrodes may be disposed on a dielectric containing a tantalum silicon oxynitride film.
申请公布号 US2010301428(A1) 申请公布日期 2010.12.02
申请号 US20100855556 申请日期 2010.08.12
申请人 FORBES LEONARD;AHN KIE Y;BHATTACHARYYA ARUP 发明人 FORBES LEONARD;AHN KIE Y.;BHATTACHARYYA ARUP
分类号 H01L29/51;H01L21/28 主分类号 H01L29/51
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