发明名称 Lithographic Apparatus and Method for Illumination Uniformity Correction and Uniformity Drift Compensation
摘要 A lithographic apparatus including a uniformity correction system is disclosed. Fingers move into and out of intersection with a radiation beam to correct an intensity of the radiation beam. Actuating devices are coupled to the fingers. A width of a tip of each of the fingers is half that of a width of the actuating devices. Systems and methods compensate for uniformity drift. An illumination slit uniformity caused by system drift is measured. First positions of uniformity compensators are determined based on the uniformity. Uniformity compensators are moved to the first respective positions. A substrate is exposed.
申请公布号 US2010302525(A1) 申请公布日期 2010.12.02
申请号 US20100789795 申请日期 2010.05.28
申请人 ASML HOLDING N.V.;ASML NETHERLANDS B.V. 发明人 ZIMMERMAN RICHARD CARL;VAN GREEVENBROEK HENDRIKUS ROBERTUS MARIE;KOCHERSPERGER PETER C.;DOWNEY TODD R.;STONE ELIZABETH;CSISZAR SZILARD ISTVAN;KUBICK FREDERICK;VLADIMIRSKY OLGA
分类号 G03B27/72;G21K1/00 主分类号 G03B27/72
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