| 摘要 |
PROBLEM TO BE SOLVED: To quickly start detecting operation of defects of a memory. SOLUTION: An inspection method of a memory for inspecting a memory in which data to be inspected is stored includes: a step of reading data to be inspected from the memory based on transfer setting information previously registered in a transfer circuit; a step of transferring the read data to be inspected to an inspecting circuit in the transfer circuit; and an inspection step of performing inspection of the memory by using the transferred data to be inspected and an inspection code for reference of the data to be inspected in the inspection circuit. COPYRIGHT: (C)2011,JPO&INPIT
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