| 摘要 |
PROBLEM TO BE SOLVED: To provide an eddy current flaw detection probe wherein the close adhesion of the projection installed on the eddy current flaw detection probe as a spacer is stabilized even in the inspection of the surface of an object to be inspected small in sharp unevenness and curvature, and a method for manufacturing the same. SOLUTION: A substrate 7 which includes a hole 7A having a diameter in which the outer diameter of the projection 5 is fitted, is adhered to a substrate 3, the surface opposite to the object 2 to be inspected of the projection 5 is closely adhered to the substrate 3, and the projection 5 is fitted in the hole 7A of the substrate 7 to hold the position of the projection 5. A substrate 10 having a hole 10A smaller than the outer diameter of the projection 5 and larger than the outer diameter of the leading end part of the protruded part of the projection 5 is adhered to the laminated substrate of the substrates 7 and 3 to keep the projection 5 housed in the space formed to the substrates 3, 7 and 10 and the projection 5 is fixed by the hole 10A of the substrate 10. COPYRIGHT: (C)2011,JPO&INPIT
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