发明名称 PATENT APPLICATION EVALUATION DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a patent application evaluation device for rationally and quantitatively evaluating the value of a patent application. <P>SOLUTION: The patent application evaluation device is configured to identify the number of applications similar to an application to be analyzed as the number of similar applications to be analyzed; to identify an analysis increase rate that is an increase per unit period of the applications similar to the application to be analyzed; to identify the number of applications similar to an application to be evaluated as the number of similar applications to be evaluated; to identify an evaluation increase rate that is an increase per unit period of the applications similar to the application to be evaluated; to identify a similar position that is a relative position of the number of similar applications to be evaluated to the number of similar applications to be analyzed; to identify an increase rate position that is a relative position of the evaluation increase rate to a plurality of analysis increase rates; and to evaluate the value of the patent application to be evaluated from the similar position and relative position, and a patent prediction value showing the possibility that the patent application to be evaluated is patented. <P>COPYRIGHT: (C)2011,JPO&INPIT</p>
申请公布号 JP2010231564(A) 申请公布日期 2010.10.14
申请号 JP20090079141 申请日期 2009.03.27
申请人 NOMURA RESEARCH INSTITUTE LTD 发明人 ARAI KATSUNORI
分类号 G06F17/30;G06Q50/00;G06Q50/26 主分类号 G06F17/30
代理机构 代理人
主权项
地址