发明名称 Flat panel X-ray detector with reduced internal scattering for improved attenuation accuracy and dynamic range
摘要 An x-ray detector is disclosed that has had all unnecessary material removed from the x-ray beam path, and all of the remaining material in the beam path made as light and as low in atomic number as possible. The resulting detector is essentially transparent to x-rays and, thus, has greatly reduced internal scatter. The result of this is that x-ray attenuation data measured for the object under examination are much more accurate and have an increased dynamic range. The benefits of this improvement are that beam hardening corrections can be made accurately, that computed tomography reconstructions can be used for quantitative determination of material properties including density and atomic number, and that lower exposures may be possible as a result of the increased dynamic range.
申请公布号 US7812314(B1) 申请公布日期 2010.10.12
申请号 US20080040180 申请日期 2008.02.29
申请人 THE UNITED STTES OF AMERICA AS REPRESENTED BY THEUNITED STATES DEPARTMENT OF ENERGY 发明人 SMITH PETER D.;CLAYTOR THOMAS N.;BERRY PHILLIP C.;HILLS CHARLES R.
分类号 G01T1/20 主分类号 G01T1/20
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