| 摘要 |
PROBLEM TO BE SOLVED: To improve efficiency of a scan test by diverting a control signal used for controlling an operation of each circuit module. SOLUTION: The circuit module M making up a scan chain in a semiconductor integrated circuit 100 includes a selection circuit 103, a shift register, and a clock gating circuit 102. A selecting operation of the selection circuit 103 for a short-circuiting path loading a scan signal and a redundancy path loading the scan signal via the shift register is carried out such that the redundance path is selected when the control signal (EN_M) supplied from a control signal generating circuit 101 allows an operation of the shift register, and the short-circuiting path is selected when the operation is not allowed. COPYRIGHT: (C)2011,JPO&INPIT |
