发明名称 |
METHOD OF MANUFACTURING OF PCRAM DEVICE |
摘要 |
PURPOSE: A method for manufacturing a phase-change memory device is provided to form a metal layer with desired patterns by applying a sacrificial film to a phase-change pattern insulating film before an etching process is performed. CONSTITUTION: A heater(240) is formed on a semiconductor substrate(200). A nitride film(231) is formed on the semiconductor substrate in order to insulate heaters. A phase-change pattern insulating film(250) is formed on the nitride film including the heaters. A sacrificial film is formed on the phase-change pattern insulating film. A mask pattern is formed on the sacrificial film in order to expose a phase-change forming region. The phase-change insulating film is etched to form a hole(250H) using the sacrificial film.
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申请公布号 |
KR20100107673(A) |
申请公布日期 |
2010.10.06 |
申请号 |
KR20090025886 |
申请日期 |
2009.03.26 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
PARK, JAE YOUNG;CHEONG, JUNG TAIK |
分类号 |
H01L21/8247 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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