发明名称 METHOD OF MANUFACTURING OF PCRAM DEVICE
摘要 PURPOSE: A method for manufacturing a phase-change memory device is provided to form a metal layer with desired patterns by applying a sacrificial film to a phase-change pattern insulating film before an etching process is performed. CONSTITUTION: A heater(240) is formed on a semiconductor substrate(200). A nitride film(231) is formed on the semiconductor substrate in order to insulate heaters. A phase-change pattern insulating film(250) is formed on the nitride film including the heaters. A sacrificial film is formed on the phase-change pattern insulating film. A mask pattern is formed on the sacrificial film in order to expose a phase-change forming region. The phase-change insulating film is etched to form a hole(250H) using the sacrificial film.
申请公布号 KR20100107673(A) 申请公布日期 2010.10.06
申请号 KR20090025886 申请日期 2009.03.26
申请人 HYNIX SEMICONDUCTOR INC. 发明人 PARK, JAE YOUNG;CHEONG, JUNG TAIK
分类号 H01L21/8247 主分类号 H01L21/8247
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