发明名称 CIRCUIT MODULE, SEMICONDUCTOR INTEGRATED CIRCUIT, AND INSPECTION APPARATUS AND METHOD THEREOF
摘要 A circuit module includes a shift register constituting part of a scan chain within a semiconductor integrated circuit, a control unit for controlling an operation of the shift register using a control signal generated within the semiconductor integrated circuit and a selection unit for selecting between a short-circuit path through which a scan signal is loaded and an ordinary path through which the scan signal is loaded after being made to go through the shift register, where the ordinary path is selected when the operation of the shift register is permitted by the control signal and the short-circuit path is selected when the operation of the shift register is not permitted.
申请公布号 US2010251047(A1) 申请公布日期 2010.09.30
申请号 US20090620727 申请日期 2009.11.18
申请人 FUJITSU LIMITED 发明人 TAMIYA YUTAKA
分类号 G01R31/28;G06F11/00 主分类号 G01R31/28
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