发明名称 POGO PIN FOR SEMICONDUCTOR TEST DEVICE
摘要 PURPOSE: A pogo pin for a semiconductor manufacturing machine is provided to improve an electrical characteristic by integratedly bending an upper contactor, a lower contactor, and an elastic part. CONSTITUTION: A main body part(110c) is inserted into the loading groove of an insulating main body. An auxiliary body part(110d) is supported by an elastic part(140) and is slid. The mountain shape of contact protrusions(120, 130) are integrated with the main body part and the auxiliary body part. The elastic part is shaped into W shape. A cutting part(142) is connected with the center parts of the main body part and the elastic part.
申请公布号 KR20100105360(A) 申请公布日期 2010.09.29
申请号 KR20100010581 申请日期 2010.02.04
申请人 LEE, HONG DAE 发明人 LEE, HONG DAE
分类号 H01L21/66;G01R1/073 主分类号 H01L21/66
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