发明名称 PRODUCT TEST DEVICE, LOT MANAGEMENT METHOD AND PROGRAM
摘要 <p><P>PROBLEM TO BE SOLVED: To facilitate specification of a range influenced when abnormality is found in a self-diagnostic result of a product test device. <P>SOLUTION: The product test device sets a test condition according to a product of a test target, and records lot information of the product performed with a test by use of the test condition associatively to the test condition. The self-diagnostic result and the test condition are collated each time the self-diagnostic result by a self-diagnostic function is obtained, and the lot information of the product performed with the test on the test condition affected by the self-diagnostic result is output. <P>COPYRIGHT: (C)2010,JPO&INPIT</p>
申请公布号 JP2010211636(A) 申请公布日期 2010.09.24
申请号 JP20090058595 申请日期 2009.03.11
申请人 RENESAS ELECTRONICS CORP 发明人 YAMAKITA NAOYA
分类号 G05B19/418;G01R31/26;G01R31/28;G06Q50/00;G06Q50/04;H01L21/66 主分类号 G05B19/418
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