发明名称 TEST SOCKET
摘要 PURPOSE: A test socket is provided to easily being manufactured and secure test reliability at the same time. CONSTITUTION: A probe(10) consisting of upper/lower plungers is inserted in a fastening hole. An insulating upper cover(3) is combined in the upper of a conductive body(2). In order to project the upper plungers, a through hole which is smaller diameter than the fastening hole is formed in a upper cover. In order to project the lower plungers, a through hole which has smaller diameter than the fastening hole is formed in the lower cover(4) of insulating. A protrusion unit is respectively projected in lower surface of the upper cover and the upper surface of the lower cover.
申请公布号 KR20100095142(A) 申请公布日期 2010.08.30
申请号 KR20090014270 申请日期 2009.02.20
申请人 LEENO IND. INC. 发明人 I, CHAE YUN
分类号 H01R33/76 主分类号 H01R33/76
代理机构 代理人
主权项
地址