发明名称 |
GENERAL-PURPOSE TEST SYSTEM USING PROTOCOL TRANSFORMATION BOARD |
摘要 |
PURPOSE: An SSD(Solid State Drive) device test system using a protocol transformation board is provided to test various kinds of semiconductor devices by using a protocol transformation board. CONSTITUTION: A system board(32) transmits a control signal for the test to testing devices under the control of a host computer, and receives a test result signal from the test devices. A testing board(34) mounts the test device thereon, and a protocol transformation board(33) transforms the control signal into a protocol of a test device from the protocol between the system board and the test board. In addition, the protocol transformation board transforms a test result signal into the protocol of the system from the protocol of the testing device between the system board and the testing board.
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申请公布号 |
KR20100095345(A) |
申请公布日期 |
2010.08.30 |
申请号 |
KR20090033701 |
申请日期 |
2009.04.17 |
申请人 |
NEOSEM INC. |
发明人 |
YEOM, DONG HYUN;LEE, KWANG HOON;CHOI, CHUN SIK;SO, JIN HO |
分类号 |
G06F11/22;G11C29/00;H04L29/06 |
主分类号 |
G06F11/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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