发明名称 GENERAL-PURPOSE TEST SYSTEM USING PROTOCOL TRANSFORMATION BOARD
摘要 PURPOSE: An SSD(Solid State Drive) device test system using a protocol transformation board is provided to test various kinds of semiconductor devices by using a protocol transformation board. CONSTITUTION: A system board(32) transmits a control signal for the test to testing devices under the control of a host computer, and receives a test result signal from the test devices. A testing board(34) mounts the test device thereon, and a protocol transformation board(33) transforms the control signal into a protocol of a test device from the protocol between the system board and the test board. In addition, the protocol transformation board transforms a test result signal into the protocol of the system from the protocol of the testing device between the system board and the testing board.
申请公布号 KR20100095345(A) 申请公布日期 2010.08.30
申请号 KR20090033701 申请日期 2009.04.17
申请人 NEOSEM INC. 发明人 YEOM, DONG HYUN;LEE, KWANG HOON;CHOI, CHUN SIK;SO, JIN HO
分类号 G06F11/22;G11C29/00;H04L29/06 主分类号 G06F11/22
代理机构 代理人
主权项
地址
您可能感兴趣的专利