PROBE HEAD FOR A MICROELECTRONIC CONTACTOR ASSEMBLY, THE PROBE HEAD HAVING SMT ELECTRONIC COMPONENTS THEREON
摘要
A probe head for a microelectronic contactor assembly includes a space transformer substrate and a probe contactor substrate. Surface mouni technology (SMT) electronic components are positioned close to conductive elements on the probe contactor substrate by placing the SMT electronic components in cavities in the probe contactor substrate, which cavities may be through-hole or non-through- hole cavities. In some cases, the SMT electronic components may be placed on pedestal substrates. SMT electronic components may also be positioned between the probe contactor aid space transformer substrates.
申请公布号
WO2010096714(A2)
申请公布日期
2010.08.26
申请号
WO2010US24817
申请日期
2010.02.19
申请人
TOUCHDOWN TECHNOLOGIES, INC.;DESTA, YOHANNES;NAMBURI, LAKSHMIKANTH;LOSEY, MATTHEW
发明人
DESTA, YOHANNES;NAMBURI, LAKSHMIKANTH;LOSEY, MATTHEW