发明名称 Apparatus for Etching Edge of Wafer
摘要 An apparatus for etching an edge of a wafer includes a chamber, a chuck disposed inside the chamber upon which the wafer is disposed, a plate spaced apart from the wafer and disposed above the wafer, and an edge ring formed along the edge of the wafer and combined with an outer periphery of the plate, wherein the edge ring comprises a ring base spaced a distance apart from the wafer to form a parallel plane with respect to the wafer, and a first ring protrusion protruding from the ring base to insulate the edge of the wafer from a central region of the wafer.
申请公布号 US2010212833(A1) 申请公布日期 2010.08.26
申请号 US20100710801 申请日期 2010.02.23
申请人 CHANG CHONG-KWANG;CHO OH-SANG;LEE IN-KEUN;KIM HYO-JEONG 发明人 CHANG CHONG-KWANG;CHO OH-SANG;LEE IN-KEUN;KIM HYO-JEONG
分类号 H01L21/306;H01L21/3065 主分类号 H01L21/306
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