发明名称 Semiconductor device having a gate contact structure capable of reducing interfacial resistance and method of forming the same
摘要 A semiconductor device has a gate contact structure, including a semiconductor substrate, a polycrystalline silicon layer used as a gate electrode of a transistor, a middle conductive layer, a top metal layer having an opening exposing the polycrystalline silicon layer, and a contact plug directly contacting the polycrystalline silicon layer through the opening.
申请公布号 US7776687(B2) 申请公布日期 2010.08.17
申请号 US20070797401 申请日期 2007.05.03
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KANG CHANG-SEOK;SHIN YOO-CHEOL;CHOI JUNG-DAL;SEL JONG-SUN;KIM JU-HYUNG;JEON SANG-HUN
分类号 H01L21/336 主分类号 H01L21/336
代理机构 代理人
主权项
地址