发明名称 |
LITHOGRAPHIC APPARATUS AND DEVICE MANUFACTURING METHOD |
摘要 |
<p>PURPOSE: A lithography apparatus and a method for manufacturing a device are provided to reduce a thermal load applied to the upper surface of a liquid limitation system by preventing the evaporation of an immersion solution from the surface of final element of a projection system. CONSTITUTION: A projection system(PL) projects patterned radiation beam toward the target region of a substrate. A barrier unit(10) surrounds a space between the projection system and the substrate to form a storing part. The external surface of the barrier unit faces toward a lyophobic external layer. An inner edge is partially formed in the lyophobic external layer in order to for the storing part.</p> |
申请公布号 |
KR20100090748(A) |
申请公布日期 |
2010.08.17 |
申请号 |
KR20100060714 |
申请日期 |
2010.06.25 |
申请人 |
ASML NETHERLANDS B.V. |
发明人 |
BECKERS MARCEL;VAN DE KERKHOF MARCUS ADRIANUS;LANDHEER SIEBE;MAAS WOUTERUS JOHANNES PETRUS MARIA;BRUIJSTENS JEROEN PETER JOHANNES;THOMAS IVO ADAM JOHANNES;JANSSEN FRANCISCUS JOHANNES JOSEPH;VAN OERLE BARTHOLOMEUS MATHIAS |
分类号 |
H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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