发明名称 REFERENCE MATERIAL FOR NONDESTRUCTIVE PHOTO-INFRARED THERMOGRAPHY AND INSPECTION METHOD OF USING THE SAME
摘要 PURPOSE: A reference material for nondestructive inspection of a photo-infrared thermography type and an inspection method using the same are provided to optimize a nondestructive inspection equipment of a photo-infrared thermography type with maximum performance showing arrangement and inspection condition based on the defect inspection result of a reference material by previously inspecting the reference material before nondestructive inspection on an actual sample. CONSTITUTION: A reference material(16) for nondestructive inspection of a photo-infrared thermography type comprises a metal plate. The metal plate has a given area. On one side of the metal plate, a plurality of defective parts are formed at equal/different intervals. The defective parts are formed in a detectable minimum diameter, a maximum diameter and any diameter between the maximum diameter and the minimum diameter. The defective parts are formed in a detectable minimum measurement depth, a maximum measurement depth, and any measurement depth between the maximum measurement depth and the minimum measurement depth. The minimum diameter of the defective part is Φ4mm and the maximum diameter Φ16mm. The defective parts of the maximum diameter and the minimum diameter are formed along with the detective parts of Φ8mm and Φ12mm on ones side of the metal plate at equal/different intervals.
申请公布号 KR20100090148(A) 申请公布日期 2010.08.13
申请号 KR20090009465 申请日期 2009.02.05
申请人 KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE 发明人 CHOI, MAN YONG;KANG, KI SOO;PARK, JEONG HAK
分类号 G01N1/28;G01N21/88;G01N25/72 主分类号 G01N1/28
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